Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...

A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

The inverted Zeiss CLSM 510 laser scanning confocal microscope is equipped with three PMT detectors, seven laser lines (405, 458, 477, 488, 514, 543, 633 nm), motorized Z-drive and a wide range of ...

The inverted Nikon N-SIM/A1 microscope is a combination structured illumination microscopy (SIM), laser scanning confocal and total internal reflection fluorescence (TIRF) microscopy system. SIM and ...

(Nanowerk News) The answer to the question how much an atomic force microscope (AFM) costs is always "it depends". The pricing of scanning probe microscopes is influenced by many factors, like the ...