A patent-pending indentation method gathers data on a range of materials for which it was previously unobtainable Using Nanovea’s Mechanical Tester in indentation mode, with a cylindrical flat tip, it ...

The most ubiquitous technique for macroscale mechanical characterization of materials is the tensile test. This is because it supplies a full stress strain curve to permit the analysis of such crucial ...

The responsibility for yield at advanced process nodes has been steadily shifting from foundries toward chip design teams. The reason traces back to an equally gradual shift in failure mechanisms from ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Design-for-manufacturing (DFM) methodologies have taken center stage in the drive to improve yields in nanometer designs. Various techniques targeted at both the initial design and the manufacturing ...