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Apriso, a leading provider of manufacturing software solutions, today announced that its FlexNet Quality application now includes visual Quality Defect Tracking (vQDT), which embeds visual imagery of ...

Amazon today announced the general availability of Amazon Lookout for Vision, a cloud service that analyzes images using computer vision to spot product or process defects and anomalies in ...

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...

Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...